PUBLICATION

This page shows the publication list on the study of "Small Angle X-ray Scattering from Polymers and Ultrathin Films". If you click the page number, you can read the original paper on the website.

Analytical Software for Transmission-Mode Small Angle X-ray Scattering

Characterization of Long-Periodic Layered Structures by X-Ray Diffraction V: Small Angle X-Ray Scattering of Distorted Multilayers

Yuji Sasanuma* and Kazuo Nakayama
Thin Solid Films, 247, 24-33 (1994).

Small Angle X-Ray Scattering of Distorted Lamellar Structures

Yuji Sasanuma,* Akihiro Abe, Takako Sasanuma, Yukishige Kitano, and Akira Ishitani
J. Polym. Sci., Polym. Phys. Ed. 31, 1179-1186 (1993).

Characterization of Industrial Materials by Small Angle X-Ray Scattering

Yuji Sasanuma,* Yukishige Kitano, and Akira Ishitani
J. Mater. Sci., 24, 1133-1139 (1989).

Radial Distribution Function Analysis and Its Applications

Atsuko Tatsumi and Yuji Sasanuma*
Toray Research Center News, 7 (4), 11-13 (1988) (written in Japanese).

Pole Figure Method and Its Applications to Thin Films

Yuji Sasanuma
Toray Research Center News, 6 (2), 34-35 (1987) (written in Japanese).

Small Angle X-Ray Scattering (SAXS) and Its Applications

Yuji Sasanuma
Toray Research Center News, 5 (2), 16-21 (1986) (written in Japanese).

Reflection-Mode Small Angle X-ray Scattering and Its Applications

Characterization of Long-Periodic Layered Structures by X-Ray Diffraction Part VI: Electron Density Distribution and Chain Orientation in a Langmuir-Blodgett Film of Cadmium Stearate

Yuji Sasanuma* and Hiroo Nakahara
Thin Solid Films, 261, 280-286 (1995).

Small Angle X-Ray Scattering

Yuji Sasanuma
In Surface Analysis Pictorial Book; The Surface Science Society of Japan, Ed.; Kyoritsu Shuppan: Tokyo, Japan, 1994 (written in Japanese).

Characterization of Long-Periodic Layered Structures by X-Ray Diffraction IV: Small Angle X-Ray Diffraction from a Superlattice with Non-Ideal Interfaces

Yuji Sasanuma,* Mamoru Uchida, Kazuyuki Okada, Katsuhiko Yamamoto, Yukishige Kitano, and Akira Ishitani
Thin Solid Films, 203, 113-120 (1991).

Characterization of Long-Periodic Layered Structures by X-Ray Diffraction III: Structure of a Langmuir-Blodgett Film of Cadmium Arachidate at Elevated Temperatures

Yuji Sasanuma,* Yukishige Kitano, Akira Ishitani, Hiroo Nakahara, and Kiyoshige Fukuda
Thin Solid Films, 199, 359-365 (1991).

Analysis of the Higher Order Structure of Molecular Aggregates

Akira Ishitani,* Hideyuki Ishida, Yoichi Nakayama, and Yuji Sasanuma
Nippon Kagaku Kaishi, No.10, 1096-1105 (1990) (written in Japanese).

Characterization of Long-Periodic Layered Structures by X-Ray Diffraction II: Lattice Distortion of Langmuir-Blodgett Films of Lead Stearate

Yuji Sasanuma,* Yukishige Kitano, Akira Ishitani, Hiroo Nakahara, and Kiyoshige Fukuda
Thin Solid Films, 190, 325-334 (1990).

Characterization of Long-Periodic Layered Structures by X-Ray Diffraction I: A System for Small Angle and Intermediate Angle X-Ray Diffraction Using a Reflection Kratky Camera

Yuji Sasanuma,* Yukishige Kitano, and Akira Ishitani
Thin Solid Films, 190, 317-323 (1990). (with the aid of Mr. Hirashima (Rigaku, Co., Ltd.), the X-ray camera is now commercially available.)

Small Angle X-Ray Diffraction and Its Applications

Yuji Sasanuma
Toray Research Center News, 6 (3), 33-35 (1987) (written in Japanese).

A Point-Focusing Small Angle X-Ray Scattering Camera Using a Doubly Curved Monochromator of a W/Si Multilayer and Image Reconstruction by the Maximum Entropy Method

Small Angle X-Ray Scattering Measurements and Image Reconstruction by the Maximum Entropy Method

Yuji Sasanuma,* Robert V. Law, Yuji Kobayashi, and Katsunari Sasaki
Anal. Chem., 69, 794-800 (1997). (as a collaboration with Rigaku, Co., Ltd., the X-ray camera is now commercially available.)

A Point-Focusing Small Angle X-Ray Scattering Camera Using a Doubly Curved Monochromator of a W/Si Multilayer

Yuji Sasanuma,* Robert V. Law, and Yuji Kobayashi
Rev. Sci. Instrum., 67, 688-692 (1996). (as a collaboration with Rigaku, Co., Ltd., the X-ray camera is now commercially available.)

Rapid Small Angle X-Ray Scattering Measurements with a Point-Focusing Camera Using a Doubly Curved Monochromator of a W/Si Multilayer

Yuji Sasanuma* and Yuji Kobayashi
Rigaku-Denki Journal, 27, 41-43 (1996) (written in Japanese).