研究実績

このページには「高分子と超薄膜の小角X線散乱の解析」に関する研究実績を掲載しています。論文のページ番号をクリックすると雑誌サイトが開き、内容を読むことができます。

透過式小角X線散乱法のソフトウェアの開発と応用

Characterization of Long-Periodic Layered Structures by X-Ray Diffraction V: Small Angle X-Ray Scattering of Distorted Multilayers: Yuji Sasanuma* and Kazuo Nakayama
Thin Solid Films, 247, 24-33 (1994).
Small Angle X-Ray Scattering of Distorted Lamellar Structures: Yuji Sasanuma,* Akihiro Abe, Takako Sasanuma, Yukishige Kitano, and Akira Ishitani
J. Polym. Sci., Polym. Phys. Ed. 31, 1179-1186 (1993).
Characterization of Industrial Materials by Small Angle X-Ray Scattering: Yuji Sasanuma,* Yukishige Kitano, and Akira Ishitani
J. Mater. Sci., 24, 1133-1139 (1989).
「動径分布関数解析法とその応用」: 辰巳敦子，笹沼裕二*
TRC News, 7 (4), 11-13 (1988).
「極点図形（ポールフィギュア）法の薄膜材料への応用」: 笹沼裕二
TRC News, 6 (2), 34-35 (1987).
「小角Ｘ線散乱法（SAXS）とその応用」: 笹沼裕二
TRC News, 5 (2), 16-21 (1986).

反射式小角散乱法の超薄膜材料への応用

Characterization of Long-Periodic Layered Structures by X-Ray Diffraction Part VI: Electron Density Distribution and Chain Orientation in a Langmuir-Blodgett Film of Cadmium Stearate: Yuji Sasanuma* and Hiroo Nakahara
Thin Solid Films, 261, 280-286 (1995).
「小角X線散乱法」: 笹沼裕二（日本表面科学会編）
表面分析図鑑, 共立出版, 1994.
Characterization of Long-Periodic Layered Structures by X-Ray Diffraction IV: Small Angle X-Ray Diffraction from a Superlattice with Non-Ideal Interfaces: Yuji Sasanuma,* Mamoru Uchida, Kazuyuki Okada, Katsuhiko Yamamoto, Yukishige Kitano, and Akira Ishitani
Thin Solid Films, 203, 113-120 (1991).
Characterization of Long-Periodic Layered Structures by X-Ray Diffraction III: Structure of a Langmuir-Blodgett Film of Cadmium Arachidate at Elevated Temperatures: Yuji Sasanuma,* Yukishige Kitano, Akira Ishitani, Hiroo Nakahara, and Kiyoshige Fukuda
Thin Solid Films, 199, 359-365 (1991).
「分子集合体の高次構造解析」: 石谷炯,* 石田英之, 中山陽一, 笹沼裕二
日本化学会誌, No.10, 1096-1105 (1990).
Characterization of Long-Periodic Layered Structures by X-Ray Diffraction II: Lattice Distortion of Langmuir-Blodgett Films of Lead Stearate: Yuji Sasanuma,* Yukishige Kitano, Akira Ishitani, Hiroo Nakahara, and Kiyoshige Fukuda
Thin Solid Films, 190, 325-334 (1990).
Characterization of Long-Periodic Layered Structures by X-Ray Diffraction I: A System for Small Angle and Intermediate Angle X-Ray Diffraction Using a Reflection Kratky Camera: Yuji Sasanuma,* Yukishige Kitano, and Akira Ishitani
Thin Solid Films, 190, 317-323 (1990). (with the aid of Mr. Hirashima (Rigaku, Co., Ltd.), the X-ray camera is now commercially available.)
「小角Ｘ線回折法とその応用」: 笹沼裕二
TRC News, 6 (3), 33-35 (1987).

二重湾曲W/Si 多層膜を用いた高輝度点収束小角X線散乱光学系の開発と最大エントロピー法による画像解析

Small Angle X-Ray Scattering Measurements and Image Reconstruction by the Maximum Entropy Method: Yuji Sasanuma,* Robert V. Law, Yuji Kobayashi, and Katsunari Sasaki
Anal. Chem., 69, 794-800 (1997). (as a collaboration with Rigaku, Co., Ltd., the X-ray camera is now commercially available.)
A Point-Focusing Small Angle X-Ray Scattering Camera Using a Doubly Curved Monochromator of a W/Si Multilayer: Yuji Sasanuma,* Robert V. Law, and Yuji Kobayashi
Rev. Sci. Instrum., 67, 688-692 (1996). (as a collaboration with Rigaku, Co., Ltd., the X-ray camera is now commercially available.)
「W/Si多層膜製２重湾曲モノクロメータを用いた点集束型カメラによる迅速小角Ｘ線散乱測定」: 笹沼裕二,* 小林勇二
理学電機ジャーナル, 27, 41-43 (1996).